On Robustness of a Sequential Test for Scale Parameter of Gamma and Exponential Distributions

Pandit, Parameshwar V. and Gudaganavar, Nagaraj V. (2010) On Robustness of a Sequential Test for Scale Parameter of Gamma and Exponential Distributions. Applied Mathematics, 01 (04). pp. 274-278. ISSN 2152-7385

[thumbnail of AM20100400003_42816838.pdf] Text
AM20100400003_42816838.pdf - Published Version

Download (183kB)

Abstract

The main aim of the present paper is to study the robustness of the developed sequential probability ratio test (SPRT) for testing the hypothesis about scale parameter of gamma distribution with known shape parameter and exponential distribution with location parameter. The robustness of the SPRT for scale parameter of gamma distribution is studied when the shape parameter has undergone a change. The similar study is conducted for the scale parameter of exponential distribution when the location parameter has undergone a change. The expressions for operating characteristic and average sample number functions are derived. It is found in both the cases that the SPRT is robust only when there is a slight variation in the shape and location parameter in the respective distributions.

Item Type: Article
Subjects: Euro Archives > Mathematical Science
Depositing User: Managing Editor
Date Deposited: 05 Jun 2023 04:06
Last Modified: 30 Oct 2023 03:57
URI: http://publish7promo.com/id/eprint/2668

Actions (login required)

View Item
View Item